Image sensor Lexicon
compiled by Bart Dierickx, version 28feb2010.
|
1/f noise |
Temporal noise with a dominantly low frequency content. In this
context the origin is typically in MOS or MOSFET interface states. Synonym of flicker noise. |
|
1T pixel |
Consisting of one photodiode and one access MOSFET, the simplest
passive pixel. |
|
1.75T and 1.5T pixels |
Are pinned photodiode pixels (see 4T) organized in groups of typically
2 or 4, whereby the floating diffusion is common. E.g. a group of 4 pixels, having 4 transfer
gates, and 1 reset, 1 source follower and 1 column switch, have 7/4= 1.75
transistors per pixel. |
|
2T pixel |
Two 2T pixels have had some limited success in the past Þ
Hitachi’s 2T pixel is a variant of the passive 1T
pixel, with two switches in series, which allows a faster readout and a
better FPN cancellation Þ
Toshiba’s 2T pixel is a variant of the 3T active
pixel, not needing a select switch.
Row selection is done by the supply line to the source follower transistor. |
|
3T pixel |
Most classic and most straightforward active pixel, having three (3)
transistors (T)(MOSFETs) and one photoreceptor. One MOSFET resets the
photoreceptor; the second is a source follower sensing and buffering the
photoreceptor node voltage; the third is the row selection switch. |
|
4T pixel |
There exits several types of four transistor pixels. Þ
The best known 4T pixel is also known as the pinned
diode pixel. Take a 3T pixel, and extend the photodiode/floating diffusion node with a
transfer gate and a pinned photodiode. Þ
Another 4T pixel is the charge-skimming (or
direct-injection) pixel, which is also a 3T pixel, where a 4th MOSFET is
placed between the photoreceptor and the voltage sense node to increase the
charge to voltage ratio. This topology
is almost identical to the pixels above, except that the photodiode charge
cannot be completely evacuated. Þ
Another 4T pixels is the snapshot shutter pixel as
used by FillFactory. This also resembles the 3T pixel, but a 4th MOSFET acts
as a track&hold switch. . Þ Caeleste’s “silencing reset” pixel |
|
absorption depth |
Light, as all electro-magnetic radiation, is absorbed (thus detected!)
in Silicon over a characteristic 'absorption' depth. Blue light is absorbed
in about 0.5 to 1 um; green light in a few um; red light in a layer over 5 to
10 um thick. Infrared light is absorbed in deeper layers. Ultraviolet light
is typically absorbed (thus not detected!) in the top oxide layers. |
|
active pixel |
Pixel, containing an active (= power dissipating) element. In most
cases the active element is a MOSFET in an amplifying or buffering
configuration. The presence of only one MOSFET acting as a switch only does
not make a pixel 'active'. |
|
active reset |
Methods to reset a pixel, that results in kTC noise reduction based in
sensing and feeding back to the sense node voltage during the reset
operation. |
|
ADC |
Analog to Digital Converter: An electronic circuit that converts an
analog voltage, as comes out of an imager core, into a digital signal. |
|
alchemy or black magic |
The part of our science that nobody really understands, but that seems
to work well until someone changes a tiny detail in some arcane procedure. |
|
Anna Karenina-effect |
The observation that one cannot make one real general purpose image
sensor (or anything else) that is “good” for all specifications. One-size-fits-all does not work as so
easily a spec will fail. In the novel by Tolstoy, the opening sentence claims that there is only
one type of happy (ideal) family, and innumerable ways to be an unhappy
family. |
|
anthropomorphic |
Properties of image sensors that are inspired by, or similar to,
properties of the human (- eye). Examples:
logarithmic response, RGB sensitivity, and log-polar geometry. |
|
APD |
Avalanche Photo Diode. Photo
diode constructed such that it can be operated in “Geiger mode”, i.e. it can
be biased beyond its breakdown voltage, and breakdown will only happen triggered
by the absorption of a photon. This breakdown can be used in photon counting. |
|
APS (1) |
Active Pixel Sensor: Image
sensor using active pixels. |
|
APS (2) |
Advanced Photo System: small format film, 30.2 x |
|
ARC |
Anti Reflective Coating: Dielectric layers on top of the receptor with
specific thickness and refractive index, so that only a minimal fraction of
the light impinging on the receptor is reflected. |
|
area sensor |
Imager with a two dimensional array, or matrix, of pixels. |
|
auto-saturation time |
The average time for a pixel to saturate due to dark current alone,
i.e. non-illuminated. The absolute
upper limit for useful integration time. |
|
BSI/BST |
backside illumination and backside thinning. An imager can be illuminated from the backside, if the silicon can be
uniformly thinned to a few micrometers. If successful, there is no
obstruction of the light by metallization and dielectric layers, and the fill
factor and UV sensitivity can be very high. |
|
Bayer pattern |
A popular type of Red-Green-Blue CFA, invented by Brice E. Bayer
(Kodak). |
|
binning (charge binning) |
Mode of operation that is available only in some types of CCD (FTCCD).
The charge of multiple pixels is accumulated and read in a single operation.
This type of binning has no noise penalty. Binning is sometimes emulated in
passive pixels, active pixels or in the digital domain. But here the noise
advantage is less prominent. Charge binning can also be done in shared pinned
photodiode pixels. |
|
The black shoe under the table -test |
Quick image sensor test done by hasty procurement officers at camera
system companies to evaluate the low-light capabilities of a camera or
sensor. In an office, with a comfortable
200 to 1000 lux illumination, the darkest spot is under the table, the
darkest object readily available there is a black shoe. Does
it image well? |
|
BLIP |
Background Limited Integrated Performance: Camera operation in a
condition where the noise is dominated by the inherent shot noise in the
background illumination level. Used in
IR imaging. |
|
bolometer |
Radiation detector sensor/pixel based on the change of temperature due
to radiation absorption. The change in
temperature is sensed and readout through a strongly temperature dependent
resistance. |
|
bulk |
Substrate. With MOSFETs, the symbol for bulk or substrate is B. |
|
bulk effect |
Normally the source-drain current through a MOSFET is regulated by the
gate potential. Nevertheless, the bulk potential has a generally unwanted
parasitic effect too. |
|
buried channel |
Similar to a MOSFET inversion layer, but by the proper game of
implantations the charge is separated from the interface. The better "buried channel" CCDs store and transfer their
charge in a buried channel under the electrodes. |
|
Buried diode |
Photo diode which by an additional junction/implant is separated from
the Si-SiO2 interface. This implant pins the interface potential
to a fixed value, likely the substrate potential. Its main effect is a reduced dark current,
as it electrically separates the interface dark current generation centers
from the collecting junction. |
|
Caeleste |
Caeleste CVBA, image sensor design house, specialized in high-end
space, medical and industrial image sensors. For the origin of the name, see www.caeleste.com/name.html |
|
CameraLink |
a historic serial communication protocol and cable format designed for
computer vision applications.
Successors to CameraLink are GigE, 10GigE, HDBaseT™, emcore, CoaxPress, LAG, USB3, … |
|
CCD |
Charge Coupled Device: Originally the name of a structure invented in
1970 of adjacent MOS gates ("electrodes") that allows both
confinement (storage) and transport of free charge. Later the name of the
modified MOS technology in which the device is made. Even later the name of
image sensors based on the CCD principle. And finally, sometimes, the generic
name of a solid state image sensor. |
|
CDS |
Correlated Double Sampling: A method to read the differential
magnitude of a charge packet, thereby canceling a source of FPN, as well as
the kTC noise that is caused by the reset of the charge packet. |
|
CFA |
Color Filter Array: the mosaic of color filters overlaid on the pixel
array. |
|
CFD [fF] |
Floating diffusion
capacitance. |
|
CFT |
Contrast Transfer Function: MTF multiplied by S/N. An attempt to
define an image sensor quality factor that favors both sharpness and
contrast. |
|
charge skimming |
Also named "direct injection", is a technique to sense
charge with a high charge-to-voltage conversion ratio. The photodiode (or
photo resistor) is at the source of a DC-biased MOSFET. The charge is
integrated at the drains side of the MOSFET. Is used in the classic 4T pixel. |
|
cheerleader effect |
A classic misconception that nature systematically compensates bonuses
by flaws. e.g. that beautiful girls must be dumb; that smart people must be
nerds or socially inapt; that CMOS image sensors must be low end. |
|
CID |
Charge Injection Device: CCD-based technique and image sensor using
this technique. Detection based on local charge transfers only and
non-destructive read out. |
|
CIE diagram |
Two-dimensional [x,y] representation of [X,Y,Z] color space. It can
represent all physical colors (and even more!). I.e. any combination of
monochromatic wavelengths, which is much more than what can be generated with
a set of three primaries (typically R,G,B). All colors that can be generated
by the linear combination of such primaries form a color triangle. |
|
CIS |
CMOS Image Sensor |
|
CMD |
Charge Modulation Device: Image sensor technology based on the
detection and charge sensing in isolated bulk (B) node of a (buried channel)
MOSFET. |
|
CMOS |
Complementary MOS: The mainstream mass manufacturing Silicon
technology. Characterized by the fact that both nMOSFETs and pMOSFETs
("complementary" pairs) can be manufactured on the same wafers. |
|
CoB |
Chip On Board: Mounting the image sensor chip directly on the PCB,
without package. Cheap but a bit
fragile, unless well protected. |
|
co-integration |
Answer to the question: shouldn’t we put a larger part of the system
(digital or analog) on the same chip as the analog imager core? |
|
column amplifier |
Charge amplifier or voltage amplifier that is located at the edge of
columns of pixels. Serves to buffer or sense the signal of one, selected,
pixel in the column. Typically, the signals of the column amplifiers are
multiplexed to one imager core output. |
|
color |
human subjective experience of pure or a mixture of monochromatic
wavelengths. |
|
color reconstruction or demosaicing. |
The raw image from an imager with CFA has only one color component per
pixel. Trivial or more clever reconstruction algorithms must restore the
missing color components for every pixel. |
|
CoM |
“Conservation of Misery”. When
you improve on one parameter (say, noise), you will inevitably sacrifice
another parameter (say power, area, speed, design time, profit…). It does not
work the other way around: when you deliberately worsen say, noise, power,
speed or your salary will not improve. Has
some affinity with the Laws of Thermodynamics (conservation of entropy), the Law
of Murphy and the Anna Karenina effect (see above). |
|
cosmetic defect |
As a spot or a mark in the face. Small defects, localized
non-uniformities, unwanted patterns, blemishes, dust particles, etc. that
degrade the image quality. |
|
cosmic radiation |
see X-rays |
|
CRT |
Cathode Ray Tube: The ancient display device, used in TV and computer
monitors. Now largely replaced by LCD. |
|
CTIA |
Charge Trans-Impedance amplifier. Amplifier, not in the sense of
voltage multiplier, but in the sense of translating the signal to a different
domain, in casu, charge to voltage domain. A "charge-to-voltage"
amplifier thus. The classic full-bred CTIA is an inverting amplifier with a
capacitor in the feedback; but simply storing a charge on a (parasitic)
capactance, and reading the voltage with a source follower, as in the 3T
pixel, is also a CTIA in principle. |
|
cushion effect, cushioning |
light flux projected through a lens is more attenuated at the sides
and corners of the image. The respons over the image area has the shape of a
pillow / cushion. The effect is caused by the reduced angle of incidence away
from the image center, and by the non-lambertian absorption of the imager. is
modeled by cos2 to cos4 laws. |
|
Specific detectivity. A figure of merit for the capability of a
receptor or receptor technology, which is invariant for area and integration
time. |
|
|
DAC |
Digital to Analog Converter: as ADC, but read the explanation back to
front. |
|
dark current |
The parasite of photocurrent. In the absence of light, a non-zero current
will flow in the photodiode, spoiling the image and adding its own shot
noise. Typically expressed in [pa/cm2], in [electrons/second] or in [V/s]
(see dark signal). |
|
dark signal |
The signal due to dark current, expressed in [V/s]. |
|
demosaicing |
See color reconstruction |
|
detector |
"Detecting" apparatus. Most people don't tell the difference
with "sensor". Sounds more "active" than
"sensor" - or does it sound more expensive? The nuclear physics community
considers a detector as the bigger apparatus containing many smaller
"sensors". |
|
dielectric layers |
Insulating, transparent (?) layers on top of the IC. Typically SiO2,
SiN. Recently "low-k" dielectrics (polymers, black diamond, porous
materials) are being introduced to lower the inter-metal capacitance for high
speed and RF applications. |
|
diode |
Electronic device with two terminals, that conducts the current in
only one direction. Originally a two-terminal vacuum tube, invented by Edison
in 1880. Nowadays it consists of a p-n junction, the juxtaposition of an
n-type semiconductor and a p-type semiconductor, typically on the same
substrate. |
|
The |
Yes! there exists a publicly accessible calibrated scene for camera evaluation
that does not look like a nearly bankrupt furry animal and grocery shop: Disneyland under a blue sky. Make a set of pictures of your kid in every
attraction while your boss signs the expense note. |
|
double slope integration |
Method to extend the dynamic range of a normally linear-transfer
imager, by combining the images taken with a long and a short integration
time into one image. The resulting
electro-optical transfer curve is bi-linear. |
|
Double Sampling |
Uncorrelated Double Sampling: A method to read the magnitude of
a charge packet, canceling a main source of FPN, but not the kTC noise. |
|
DQE |
Detective quantum efficiency [%].
Quality factor used of X-ray detectors, combining the absorption, S/N
ratio and MTF. |
|
DSNU |
Dark Signal Non Uniformity, expressed in [V/s]RMS or VRMS.
The spatial noise due to the pixel-to-pixel non-uniformity of the dark
current. |
|
DSP |
Digital Signal Processor: software-programmed or hardwired logic device,
specialized in performing many calculations at high speed on a signal. The
raw image coming from an imager can be/needs to be post-processed in the
digital domain. |
|
dSNR |
or dS/dN, differential signal to noise ratio: ratio between the signal
and the noise in the same operation point. |
|
dummy pixels |
A pixel array features some rows/columns of real but unused pixels at
its perimeter, thus ensuring that the "useful" pixels are not
affected by peripheral circuitry. |
|
dynamic range |
ratio of highest non-saturating optical flux on the smallest
detectable flux for a sensor. Is equal to the signal to noise ratio (SNR) if
and when the sensor features a linear transfer curve. |
|
electron |
Elementary particle with negative unit charge. |
|
electronic shutter |
A method to operate an electronic image sensor in a way that the
effective integration or exposure time (shutter time) is variable. The result
is the same as that of the mechanical shutter found on the classical photo
camera. |
|
EM |
Electro-Magnetic radiation: Visible light is just one small part of
the huge EM spectrum. |
|
EMC |
Electro-Magnetic Compliance: the property to emit no (or little) radio
wave EM radiation, or to be insensitive for spurious EM radiation or EMI. |
|
EMI |
Electro-Magnetic Interference: System noise. |
|
epi wafers |
Epitaxial wafers. Most CMOS image sensors need processing on highly
doped wafers with on top a few microns thick "epitaxial layer" of
lowly doped silicon. |
|
in many cases still the reference in electronic vision. Superb image
quality mostly thanks to the huge image correction engine behind it. |
|
|
f number |
(sometimes written as f# or f/#) Ratio between the opening (diameter)
of the lens and its focal length. A high f-number means a large attenuation
of the light power. A low f number is beneficial for low light imaging, but
low f-numbers have also low depth of focus and are vulnerable to lens
imperfections: |
|
FEA |
Field Emission Array: Micro-machined silicon device that combines the
light detecting mechanism of a Vidicon tube and the circuit possibilities of
an integrated circuit. |
|
FF CCD |
Full Frame CCD: A FT CCD lacking storage area. Needs an external shutter. |
|
fill factor |
FF: ratio [%] of the light sensitive area of a pixel on its total
area. Should be quoted in conjunction
with spectral response. |
|
FillFactory |
Flemish image sensor design house, active from 2000 till 2004 focusing on custom-designed and standard
CMOS Image Sensors. Predecessor of
Caeleste. |
|
FireWire |
FireWire or IEEE-1394: industry standard high speed serial link |
|
floating diffusion |
Circuit technique for the conversion of (photo) charge to a voltage. Used in most CCDs and in most APSs. |
|
flux |
Light power per unit area [W/m2]. Light
intensity. |
|
FPN |
Fixed Pattern Noise, or spatial noise. Is the unwanted static (DC)
variation of the response of all pixels in the image. Expressed as an offset
in volts or in ADC bits. |
|
frame |
The electronic form of one image. |
|
frame rate |
The frequency at which consecutive images are taken by a camera. |
|
frame time |
The time it takes for an imager to capture and output an image and be
ready for the next frame. Equals
1/frame_rate. |
|
FT CCD |
Frame Transfer CCD. |
|
full well charge QFW or QSAT |
Saturation charge or “full well” charge: the charge or number of
electrons that can be stored in the pixel, at saturation illumination. |
|
gamma |
Response correction in cameras originally introduced to counteract the
non-linear response of CRTs. The typical gamma correction takes the signal -
or each of the R, G, B components - to the power of 0.45. see
also here |
|
gamma rays |
see X-rays |
|
gate G |
Control terminal of a MOSFET. In a CCD the gates are called
"electrodes". |
|
GND |
Ground. The zero reference voltage in most electronic circuits. In our
science it is typically defined as equal to the substrate voltage, sometimes simplistically
called substrate potential. |
|
gray [Gy] |
SI unit of radiation dose, used in X-ray and particle imaging. A dose of 1Gy corresponds to a radiation
energy of 1J deposited in 1kg of material (body tissue). For a relation between dose in Gy see here. |
|
hole |
In a semiconductor the local absence of a bound electron, acting to
all intents and purposes as a free charged particle with positive unit
charge, and thus opposite of a negatively charged free electron. A hole is
absolutely not the same as a positron, the anti-electron, which also has a
positive unit charge, but which is a real physical (but rare, and thus
expensive) particle. |
|
horror vacui |
Fear of emptiness (Latin). The natural fear of an image sensor
designer for empty silicon, and her/his insuppressible desire to fill this
space with circuits, test structures, yield killers, logos, etc. |
|
hue |
A number indicating the spectral component of a color. The
"H" in LHS. scalar number indicating the spectral component
continuously from read-yellow-green-cyan-blue-magenta-red. |
|
hybrid |
Imager consisting of a CMOS readout array chip and a separate detector
chip. |
|
IL CCD |
InterLine CCD. |
|
image processing |
Digital domain operations in hardware or software on images or image
sequences. · Typical "early" image processing
operators are: spatial and temporal filtering, non uniformity calibration,
defect corrections, offset and gain correction, gamma correction, color
reconstruction, demosaicing, white balance, saturation and hue correction,
matrixing. · Amongst typical "smart" operators
are: image compression, code recognition, image interpretation, segmentation,
correlation, feature recognition, automatic measurements, demodulation, time
gating, distance ranging, ... |
|
imager |
Combination of the words image and sensor. |
|
imager core |
The essential part of an image sensor chip. In fact nothing more than
the pixel array and the immediate peripheral circuits required to operate the
pixel array. |
|
integration time |
Exposure time or electronic shutter time. The time span during which
light is being converted to charge and accumulated in a pixel. |
|
intelligent image sensor |
Smart sensor. The question is: what is "intelligent"? The
first image sensor that can give an answer to that question is really
intelligent. |
|
intensity |
radiative power per unit area; flux. Expressed in [W/m2] or
[lx] (see luminance) |
|
interface (1) |
In this science (CMOS technology) the border between Silicon and whatever
is on top. The favorite meeting place for embarrassing things like dark
current generation centers and 1/f noise centers. |
|
interface (2) |
At system level it usually is the hardware/software entity that links
camera or camera chip to a system. Examples:
video (PAL, NTSC), FiWi, USB, CameraLink, ... |
|
interlacing |
In the CCIR (PAL) and EIA (NTSC) video formats, the image information
is divided in odd and even (sub) frames. Alternating frames contain only the
odd or even lines. Imagers for these formats should read their lines in the
same sequence. |
|
intrinsic or i-type |
Undoped Silicon has (in theory) a low concentration of both holes and
electrons. To distinguish it from n- or p- type, it is indicated by
"i". |
|
inversion layer |
Under the influence of an electric field an n-type material can
contain a majority of holes, and thus "invert" effectively to p-type,
or vice versa. The inversion layer under a MOSFET gate is the conducting path
of the MOSFET. |
|
IR |
Infra Red: EM radiation with wavelengths longer than the visible
light.
|
|
IR cut-off filter |
Silicon photodiodes are sensitive for light with wavelengths between
350 and 1100 nm. The human eye sees light with wavelengths between 350 and
750 nm (the "visible spectrum"). An IR cut-off filter is a piece of
special glass, or another material, put in front of the image sensor and
absorbing or reflecting the light outside the visible spectrum. Quite necessary for color sensitive imagers. |
|
ISO |
Empirical measure of the light sensitivity or speed of photographic
film. Transferring this to an electronic image sensor spec is a real shot in
the dark. See ISO standard 12232. |
|
junction |
The place where a two materials join.
In semiconductor diodes: the border between the p- and the n-
material. |
|
kTC |
Boltzmann’s constant * absolute temperature * capacitance. The
thermodynamic uncertainty on the amount of charge left on a capacitor after
disconnecting it from a DC voltage source. kTC noise is sometimes called
“reset noise”. |
|
LCD |
Liquid Crystal Display: One type of flat panel display, based on the
light polarizing capabilities of so called liquid crystals in an electric
field. |
|
linear response |
a light power (P) to voltage (V) conversion that can be approximated
by a linear relation as: V = something x P. |
|
linear sensor |
Image sensor with a one-dimensional array of pixels, i.e. one or a few
rows of pixels. Don't confuse it with a
linear response image sensor. |
|
LHS |
luminance - hue - saturation: an alternate way to represent colors in
a 3 dimensional space. Is more suitable for certain image processing
algorithms than the RGB space. |
|
logarithmic response |
A light power P to signal voltage V conversion that can be
approximated by a logarithmic relation as: V = something x log(P). |
|
log-polar geometry |
Arrangement of pixels, organized in concentric circles, with a
constant number of pixels per circle. The pixel size is smallest in the
center and grows towards the edges. This
mimics the human retina. |
|
luminance |
The human vision spectrally weighted "light intensity" or
"black&white" component of a color image, or of a color video
signal. The "L" in LHS, the "Y" in YUV. Carries
sharpness, contrast, dynamic, dark/light/grayscale. Luminance is proportional
to light power. The CIE notion "lightness" (L*) is a non-linear
perceptual derivate of luminance. The notion "Luma" (Y') is a
video-technique non-linear look-alike of luminance. |
|
lux [lx] |
Human eye equivalent (i.e. subjective) of the objective light flux
measured in W/m2. As the spectral sensitivities of the eye and Silicon are
not matched, there is no general conversion factor between lx and W/m2. As a
rule of thumb, consider 1W/m2 = 100lx (visible white light) to 250lx (visible
+ NIR). |
|
matrixing |
Early image processing operator that can be described as a 3x3 matrix
operation on the R, G and B color channels.
It implies white balancing and
hue/saturation correction. |
|
micro lenses |
Technique to increase the fill factor of pixels by giving each pixel a
tiny individual lens that converges all light on the even-tinier photodiode
below it. |
|
multiple slope operation |
as double slope, with more than 2 slopes. |
|
MOS |
Metal Oxide Semiconductor: In medieval times MOSFETs were made as a
stack of Aluminum (metal) on SiO2 (oxide) on Silicon
(semiconductor). Today the Aluminum is in most cases replaced with
Polysilicon, but the name persisted. |
|
MOSFET |
MOS Field Effect Transistor: transistor type based on the MOS layer
structure. The current between source (S) and drain (D) passes through the
inversion layer that is controlled by the voltage at the gate (G). |
|
MTF |
Modulation Transfer Function: Ratio between the amplitudes of a
sinusoidal pattern in the optical image and the resulting electronic image. A measure for a sensor's inherent sharpness of
focus. |
|
NA |
Numerical aperture. 2NA =
1/f# |
|
Noise Equivalent Power |
|
|
NIR |
Near InfraRed: EM radiation between 750 and 1100 nm, invisible for the
eye, but still visible for Silicon. |
|
nMOSFET |
n-type MOSFET, a MOSFET in which the conduction between n-type source
and drain happens by electrons. |
|
noise |
A word with many meanings. In our science it is the unwanted
fluctuation of the signal of one pixel over time. To differentiate from
spatial/static noise it is sometimes called "temporal noise" (N [VRMS]
or QN [electrons]) |
|
NDR |
Non-Destructive Readout. Mode of operation of CCDs and CMOS image
sensors, where the size of a charge packet is read, without resetting it.
This information can thus be read several times, so as to improve the S/N of
the reading operation |
|
n-type |
Under zero electric field and equilibrium an n-type semiconductor
contains a majority of electrons and few holes. n-type Silicon is usually
obtained by doping with donor ions. |
|
Nyquist limit |
The Nyquist limit equals to the spatial frequency 1/(2 x pixel pitch) of
a pixel array. Image information beyond this limit is "aliased" to
lower spatial frequencies. In practice this aliasing appears as Moiré effects
and color artifacts. |
|
optical cross talk |
Light impinging on a pixel can influence the signal of neighboring
pixels through various mechanisms: diffraction of light, diffusion of photo
charge towards the neighbor, or plain electrostatic cross talk. Together these make up optical crosstalk. |
|
passive pixel |
Pixel not containing an active element, so essentially a photodiode
with access switches. The most obvious passive pixel is the 1T pixel. |
|
photo diode |
All silicon diodes or p-n junctions are sensitive to light. A diode
that explicitly is designed for detecting light is a photo diode. |
|
photodiode array |
Image sensor consisting of an array of passive pixels, where the
passive pixels contain only a photodiode and a multiplexing switch. |
|
photo gate |
Light receptor made as a MOS structure. Can be understood as a p-n
photo diode, where one of the parts is the inversion layer under the MOS. |
|
photoelectric effect |
The basic mechanism of light detection in any solid state imager. A
quantum of energy from the impinging EM radiation (a photon) excites a bound
electron to an unbound state. |
|
photo receptor |
or light receptor. The light sensitive device in a pixel (in this
science). Typically a photodiode, a photo transistor or a photo resistor. |
|
photon |
The light quantum. The unit of energy exchanged in a single interaction
between EM radiation and a charged particle. |
|
Photon counting |
Detecting individual photons and counting these events. |
|
PIN diode |
p-n diode with a relatively important lowly doped (intrinsic) layer
"i" sandwiched between the p-type and n-type regions. Due to its deep collecting volume suitable
for IR and X-ray detection. Due to its thick depletion layer having a low
capacitance. |
|
pinned diode |
Buried (photo) diode with the additional feature that it can be
completely depleted, and thus emulate complete charge transfer as in a CCD. |
|
pixel |
From picture + element. Originally the atom of a
photograph, of an electronic image, of an electronic display. In our
profession the atom of an image sensor. Minimally contains a receptor and
elementary means to feed the information to the outside world. |
|
plasma display |
Type of flat panel display, based on the emission of light by the
interactions of free electrons in an ionized gas (plasma). |
|
pMOSFET |
p-type MOSFET, a MOSFET in which the conduction in the inversion layer
between p-type source and drain happens by holes. |
|
potential |
Local property of a position in space. Energy that must be given to or
taken from a hypothetical free electron to be stable at that certain
position. Is a relative measure, thus it must be referred to some
"reference". In absence of any reference the reference is the
potential in vacuum at an infinite distance. Ever tried? |
|
preview mode |
Mode of operation of a large, slow-scan, imager: It is read at high
frame rate but at reduced resolution. “Video
mode”. |
|
PRND |
Do not confound with PRNU. Seen on automatic gear boxes in US cars. Park-Reverse-Neutral-Drive. |
|
PRNU |
Photo Response Non-Uniformity: non-uniformity in the slope of the
photo-electric transfer curve between pixels. Also see spatial noise. |
|
PSD |
Position Sensitive Device: A solid state optical sensor that outputs
analog signals that are measures of the position of a light spot on the
sensor. |
|
pseudo-random CFA |
mosaic color filter array, where the colors are attributed to pixels
in a (pseudo) random way. The purpose is to suppress color-moiré or
color-aliasing. There is some
anthropomorphic aspect in it too. |
|
PSF |
Point Spread Function. The
“effective shape” of a photodiode. MTF
is the Fourier transform of the PSF. |
|
p-type |
Under zero electric field and equilibrium a p-type semiconductor
contains a majority of holes and few electrons. p-type Silicon is usually
obtained by doping with acceptor ions. |
|
push broom imager |
A linear imager scanning a two-dimensional scene. Often used for earth
imaging. |
|
QE quantum efficiency |
Ratio [%] between the number of generated electrons and the number of
impinging photons. Closely related to
spectral response. |
|
QFW, Qsat |
“Full well” charge, a term persisting from the CCD era: the maximum
charge a pixel can contain and readout.
Used as a synonym is saturation charge, the charge at which the pixels
saturates. |
|
QN, Qnoise |
Noise charge, generally expressed in “noise electrons” |
|
random addressing |
A mode of operation of an image sensor, where pixels are addressed and
read individually and randomly, like a RAM or ROM. |
|
receptor |
The generic name of an elementary radiation sensitive device. Photodiodes,
film grains, eye cones and rods are examples of light receptors. |
|
rel DE pixel |
Magnitude of the responsivity of a pixel referred to the threshold of
nominal light detectivity. Is a measure for the capabilities of a
specifications writer. |
|
reset |
In the imager context, reset means clearing the charge contents of a
pixel to the initial dark value. |
|
RGB |
Red Green Blue: In most color cameras light is separated in 3
components labeled red, green and blue. This matches the 3-color sensitivity
of the human eye and the 3 phosphor emission of color TV displays. Alternative, complementary, colors are sometimes used: Ye (yellow), Cy
(cyan) and Ma (magenta). The choice is
not even limited to these 6 colors. |
|
ROI |
Region of interest. See Windowing. |
|
ROIC |
Read out IC: the (often CMOS)
readout part of a hybrid image sensor. |
|
rolling shutter |
Also curtain shutter, blade shutter. Moving slit
mechanical shutter as used in SLR photo cameras. Ubiquitous type of electronic
shutter which does not expose all of the image's pixels in the same period of
time. Contrary of synchronous shutter. |
|
RTS |
Random Telegraph Signal. The noise of a single trap or interface
state, seen in (1)
stepwise two-level variation of MOSFET Vth. Is of the same origin as
MOSFET 1/f noise, presumably interface charge traps modulate the conductivity
of part of the nearby MOSFET channel. (2)
stepwise variations of rate of a generation center. This is seen in pixels
with a random on/off keying of the dark current. the origin seems to be a
geometrically close pair of a generation center and a coulomb trap. The
coulomb trap's state modulates the generation center's rate. Are often seen
as the result of displacement damage by proton or other heavy particle
radiation. |
|
|
Signal to noise ratio: Ratio between the saturation signal (in volts)
and the noise level (in volts RMS). |
|
saturation (1) |
The light level (the input quantity) or voltage (the output quantity)
at which the pixel has received so much light that its differential response
drops to zero. |
|
saturation (2) |
Property of a color, more or less synonym to spectral purity.
unsaturated colors are pale or greyish. Back, white and grey have zero
saturation. Maximal saturation occurs for pure spectral colors. The "S" in LHS. |
|
scintillator |
Material in which X- (also γ and UV-) photons
convert into a visible light flash, which are subsequently detected in an
underlying image sensor. |
|
sensitivity |
The property of a good sensor. A word with too many meanings to list
here. The difference with detectivity and
responsivity is not clear. |
|
sensor |
"sensing" apparatus. In our world a circuit that in some way
is able to sense the amount of incoming electromagnetic radiation. Most people don't see the difference with
"detector". |
|
sequencer |
Digital circuit that generates the pulse trains that are necessary for
the proper operation of an analog imager core. |
|
shot noise |
The fundamental statistical uncertainty on the amount of
photoelectrons that are generated by light falling on a photoreceptor. |
|
SLR |
Single Lens Reflex
(-camera) |
|
smart pixel |
Pixel with built-in intelligence, which can be analog or digital
operators, event triggering, event counters, smart reset, systolic arrays,
ADC-in-pixels, etc. |
|
smart sensor |
Imager combined with logic, on one chip. The chip should interpret,
rather than just outputting the image contents. |
|
SPAD |
Single Photon Avalanche Diode.
See APD. The same as an APD in
“Geiger” mode. |
|
spatial noise |
the generic description of static (non temporal) non uniformities in
the imager. The three most prominent components are FPN, PRNU and DSNU. See under these chapters. |
|
spectral response |
SR: Response of a photoreceptor as function of wavelength. In most cases
the ratio between the photocurrent and the light power (or: photo current
density and light flux). Expressed in
[A/W]. |
|
stitching |
lithographical composition of a large area image sensor by many
exposures of smaller entities |
|
storage gate |
MOSFET gate or CCD electrode that stores charge in the inversion layer
or buried channel underneath. |
|
striations |
(1) year ring -like modulation of dopant concentration in grown
crystals and thus in wafers. can sometimes become visible in an imager's image,
as offset variations (FPN), as PRNU, or as dark current variations. (2)
radial lithographical faults due to photoresist hindered by the wafer
topography during spinning. |
|
subsampling |
Mode of operation of an image sensor. Pixels are read sequentially,
but not contiguously. I.e. some pixels are skipped, to obtain an image with
lower resolution, and perhaps at a higher frame rate. |
|
substrate |
The bulk of the integrated circuit. The "useful" circuits
normally lie only on or just below the surface. |
|
synchronous shutter |
Also global shutter. A type of electronic shutter, where all
pixels in the imager are sensitivity to light during exactly the same time
span. Differs from the rolling shutter, where the instant of light
sensitivity depends on the pixel's position in the image.
|
|
tape-out |
In earlier days the (CAD-) design file was sent to the foundry or the
mask shop on a magnetic tape. Today
this goes via email or FTP. |
|
TDI |
Time Delay Integration: Mode of operation of an area CCD to obtain
very high sensitivity. |
|
transfer gate |
MOSFET gate or CCD electrode that acts as a switch preventing or
allowing the transfer of (photo-) charge. |
|
trappist |
Benedictine monk, following the rule of the abbey of La Trappe. Later
the beer brewed by these monks. Later the reward for finding a fatal error in
the design of a CMOS image sensor. Later the name of such an error. http://www.trappist.be/ |
|
twin well |
In a twin well CMOS process, there is of course the "real"
well, but also an implant of opposite type to increase the doping level of
the substrate. All recent CMOS processes are twin well. A “triple well” is a twin well combination,
that is embedded in a lower doped “tub”. |
|
UDS |
Uncorrelated Double
Sampling, as opposed to CDS. See DS. |
|
UV |
Ultra Violet, EM radiation with wavelenghts shorter than the visible
light, typicall the range 10nm to 400nm.
|
|
VDD |
Supply voltage of the polarity associated with "D", the
drain of nMOSFETs. The general supply voltage of an integrated circuit.
Typically 5, 3.3, 2.5, 1.8, 1.5, 1.0 and even lower volts referred to GND. |
|
Vacuum tube (CRT-) based image sensor. |
|
|
voltage |
Potential, but corrected for the material's work function and diffusion
potentials, and is thus identical to the “Fermi potential”. Is measured with
a voltmeter. Reference is typically called “ground” (GND). |
|
VSS |
Supply voltage of the polarity associated with "S", the
drain of nMOSFETs. Typically equal to
GND. |
|
well |
In Complementary MOS (CMOS), nMOSFETs and pMOSFETs cannot be placed in
the same substrate. One of them must reside in an area of the opposite type
as the substrate. In a p-type wafer the nMOSFETs are in the p-type substrate,
and the pMOSFETs are in the n-type (n-)well. |
|
windowing |
A mode of operation of an image sensor, where only the pixels within a
region of interest (ROI) are read out. |
|
wonderbra image sensor |
Sales demonstration of a mediocre quality image sensor, where the
quality of the resulting images are "pushed up" by external means
like image post-processing, defect hiding, etc. |
|
X-rays |
In general the electromagnetic radiation with a wavelength (roughly)
shorter than 1 nm. More specifically the radiation emerging from deceleration
of electrons (Bremsstrahlung), which is the key difference with gamma rays
(originating from nuclear reactions) or cosmic radiations (originating from
astronomical objects). |